© 2015, Pleiades Publishing, Ltd. An image of a ZrOx-SiO2 multilayer structure with a magnification factor of 46, recorded in the mode of high-resolution transmission electron microscopy, and the absorption profile of the multilayer structure, recorded by scanning X-ray microscopy, are obtained using X-ray compound refractive lenses (CRL). Based on these results, a conclusion can be drawn regarding the possibility of using the multilayer structure as a universal test object for high-resolution X-ray microscopy.
Medvedeva, S.S., Lyatun, I.I., Ershov, P.A. et al. J. Synch. Investig. (2015) 9: 341. https://doi.org/10.1134/S1027451015020354